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This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the gate driver due to external physical stress. Simulation results showed the proposed circuit operates well. In order to verify the circuit operation, it was fabricated with indium gallium zinc oxide thin film transistors process. The measurement results also verified that our proposed fault detection circuit could detect the types and locations of the LD and LVS of the gate driver successfully. However, we found that HVS can be detected, but further study is needed to accurately detect the position of HVS in the proposed circuit.INDEX TERMS Fault detection, stretchable display, gate driver circuits.

In this paper, a new precharging method without any side effects is proposed to overcome image degradation caused by insufficient charging times. This work explains why the precharging method can compensate for short charging times. However, side effects of the precharging method in the form of horizontal line artifacts are addressed, wherein line artifactcompensating precharging (LCP) is presented to mitigate the side effects. Behavioral modeling is employed to investigate the side effects by estimating transient responses of a liquid crystal display. The LCP proves that it can dramatically reduce line artifacts caused by precharging because the brightness difference of adjacent pixels does not exceed 1.0.

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