From wafer sort to yield learning is a long, complex process. Even worst because when scan chains fail, wafer sort adds negligible value. To address this gap a fast, reliable and accurate localization technology for scan chain fails that enable rapid translation of these into yield learning is presented.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.