Here the fabrication of an inorganic metal‐halide perovskite CsPbBr3 based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm2 range. The CsPbBr3 film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm2 V−1 s−1. An X‐ray to current conversion rate of 1450 mC Gyair−1 cm−2 at an electric field of 1.2 × 104 V cm−1 and a detection limit in the sub µGyair s−1 regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr3 films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.

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