It has been known that a charged polaron will reach a constant speed after being accelerated only for a short time in an electric field. Within a dynamical nonadiabatic evolution method, we simulate the motion of polaron under the influence of the electric field which is present for different periods. We find the lattice oscillation behind the polaron will be localized and separated with the moving polaron once the electric field is turned off. It is shown that the localized lattice oscillation is nothing but a breather, specifically, a moving multibreather excitation. Furthermore, it is the breather which bears the incresed energy due to the electric field acting on the polaron, so that the polaron can move at a constant speed even in the presence of an electric field.

Restricted numerical range: A versatile tool in the theory of quantum informationA gate is called an entangler if it transforms some ͑pure͒ product states to entangled states. A universal entangler is a gate which transforms all product states to entangled states. In practice, a universal entangler is a very powerful device for generating entanglements, and thus provides important physical resources for accomplishing many tasks in quantum computing and quantum information. This paper demonstrates that a universal entangler always exists except for a degenerated case. Nevertheless, the problem how to find a universal entangler remains open.

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To find nontrivial high dimensional integrable models (especially in (3+1)-dimensions) is one of the most important problems in nonlinear physics. A systematic method to find some nontrivial high dimensional integrable models is established by means of noninvertible deformation relations. Starting from a noninvertible Miura type transformation, we find that the (1+1)-dimensional sinh-Gordon model appearing in many physical fields is a deformation of the (0+1)-dimensional Riccati equation. A high dimensional Miura type deformation (including two different (3+1)-dimensional reductions) of the heat conduction equation is proved to be Painlevé integrable. Some special types of explicit exact solutions, like multi-plane and/or multi-camber soliton solutions, multi-dromion solutions and multiple ring soliton solutions, are obtained.

A flexible and multipurpose Single Event Effects (SEEs) testing system was developed for evaluating the reliability of nanoscale Very Large Scale Integrated Circuit (VLSI). The accurate detection, comparation and classification of latch-up, upset, and functional interrupt were achieved. In host PC part, two customized software systems were developed, including the Procise for maximal resources occupation and a C # based visual control interface for real-time communication. For hardware, a motherboard-daughterboard system guaranteed testing performance and kept its compatibility throughout testing. The fault injection and 181 Ta 31+ irradiation results indicated the validity of proposed measurements and the stability of hardware operation. Importantly, the high anti-irradiation performance of device was also verified.