In this study, we demonstrate that the resistive switching phenomena mainly occur at the boundary between ZnO nanorods by forming conducting filaments along the boundary in Au/ZnO nanorods/AZO structure. Conducting atomic force microscope study was conducted to confirm the location of conducting path between ZnO nanorods. Furthermore, the reliable resistive switching behavior was obtained from well-aligned boundary by vertically and compactly grown ZnO nanorods on the Al doped ZnO substrate.
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