We report a new way to slow down the spontaneous emission rate of excitons in the wetting layer (WL) through radiative field coupling between the exciton emissions and the dipole field of metal islands. As a result, a long-lifetime decay process is detected in the emission of InAs/GaAs single quantum dots (QDs). It is found that when the separation distance from WL layer (QD layer) to the metal islands is around 20 nm and the islands have an average size of approximately 50 nm, QD lifetime may change from approximately 1 to 160 ns. The corresponding second-order autocorrelation function g (2) () changes from antibunching into a bunching and antibunching characteristics due to the existence of long-lived metastable states in the WL. This phenomenon can be understood by treating the metal islands as many dipole oscillators in the dipole approximation, which may cause destructive interference between the exciton dipole field and the induced dipole field of metal islands.

We proposed a precise calibration process of Al 0.9 Ga 0.1 As/GaAs DBR micropillar cavity to match the single InAs/GaAs quantum dot (QD) exciton emission and achieve cavity mode resonance and a great enhancement of QD photoluminescence (PL) intensity. Light-matter interaction of single QD in DBR micropillar cavity (Q ∼ 3800) under weak coupling regime was investigated by temperature-tuned PL spectra; a pronounced enhancement (14.6-fold) of QD exciton emission was observed on resonance. The second-order autocorrelation measurement shows g (2) (0)=0.070, and the estimated net count rate before the first objective lens reaches 1.6×10 7 counts/s under continuous wave excitation, indicating highly pure single-photon emission at high count rates.