Objective: To investigate the effect of micro assistant combined with image storage and transmission system based virtual imaging system in medical imaging internship teaching. Methods: a total of 61 imaging professional students who entered the Department of imaging, the Second Affiliated Hospital of Qiqihar Medical College, from August 1st 2019, were randomly divided into test group and control group in the Department of trial. Results: The students in the test group were significantly better than the students in the control group in attendance examination performance, the difference was statistically significant, in the satisfaction survey of teaching methods, the micro - Assistant combined with PACS based virtual imaging system teaching methods were significantly higher in student satisfaction than the traditional teaching methods. Conclusions: the combination of micro assistant and PACS based virtual imaging system in medical imaging internship teaching can improve students' knowledge of the imaging characteristics of diseases.

SUMMARYIn this paper, we propose an enhanced fault model to increase coverage in detecting physical faults in LSI. First, as an alternative to the single stuck-at fault model, we propose the single gate logical fault with Hamming distance 1 (SGLFH1) model, which is capable of generating test pattern sets that detect more defects from the same number of faults. The characteristics of this fault model are discussed and the effectiveness of the test pattern sets generated by it is described. Next we show that the multiple detection test pattern set for single stuck-at faults that is conventionally used to enhance defect coverage does not detect SGLFH1 faults satisfactorily. In addition, the effectiveness of the proposed model is shown by comparing the fault detection ratio of the SGLFH1 test pattern set for physical surrogate faults [1,2] with the corresponding fault detection ratio of the multiple detection test pattern set for single stuck-at faults. © 2001 Scripta Technica, Syst Comp Jpn, 32(6): 3644, 2001

This paper presents a logical fault model, the single gate logical fault with Hamming distance 1 (HISGLF) model, designed to enhance the defect coverage of test sets. Although some characteristics of the HlSGLF model are similar to those of the single stuck-at fault (SSAF) model, a test set derived from the HlSGLF model is capable of covering more defects than one derived from the SSAF model. Most of the existing ATPGs for the SSAF model can be easily modifled for the HlSGLF model. Experimental results show the effectiveness of the fault model.

On a new embedded flash platform we have got high failure rate on charge pump test. It is impossible to directly force external current into failure signal path to do FA but we did it under dynamic condition. Afterwards we have captured metal short locations by emission scope which is rarely seen. Then we used in-line KLA SEM VC scan to define the real failure mechanism -a new type of antenna effect, and finally solved it with combined process condition changes. We named the new type of antenna effect "Floating Antenna Effect".