Hexagonal boron nitride (h-BN), together with other members of the van der Waals crystal family, has been studied for over a decade, both in terms of fundamental and applied research. Up to now, the spectrum of h-BN-based devices has broadened significantly, and systems containing the h-BN/III-V junctions have gained substantial interest as building blocks in, inter alia, light emitters, photodetectors, or transistor structures. Therefore, the understanding of electronic phenomena at the h-BN/III-V interfaces becomes a question of high importance regarding device engineering. In this study, we present the investigation of electronic phenomena at the h-BN/GaN interface by means of contactless electroreflectance (CER) spectroscopy. This nondestructive method enables precise determination of the Fermi level position at the h-BN/GaN interface and the investigation of carrier transport across the interface. CER results showed that h-BN induces an enlargement of the surface barrier height at the GaN surface. Such an effect translates to Fermi level pinning deeper inside the GaN band gap. As an explanation, we propose a mechanism based on electron transfer from GaN surface states to the native acceptor states in h-BN. We reinforced our findings by thorough structural characterization and demonstration of the h-BN/GaN Schottky diode. The surface barriers obtained from CER (0.60 ± 0.09 eV for GaN and 0.91 ± 0.12 eV for h-BN/GaN) and electrical measurements are consistent within the experimental accuracy, proving that CER is an excellent tool for interfacial studies of 2D/III–V hybrids.

High thermal conductivity is an important parameter for nitride-based power electronic and deep-UV light emitters. Especially in the latter case short period superlattices and multicomponent alloys are used and the knowledge of the thermal properties of the binary compounds is sufficient. In-plane and cross-plane thermal conductivity of AlGaN/GaN superlattices were measured by differential two-wire 3ω method in the temperature range from 147 to 325 K. Samples were grown by metalorganic vapor phase epitaxy; the structure quality and accuracy of superlattice structures preparation were verified by means of HRXRD and transmission electron microscopy. It was observed, that value of thermal conductivities decrease with decreasing period thickness, while temperature dependencies differ from each other—in-plane thermal conductivity decreases, and cross-plane—increases with increasing temperature. Callaway method was used for thermal conductivity calculation; dependence of boundary scattering rate on the phonon wavelength was taken into account. Minimum thermal conductivity was added to calculated values to include the influence of high frequency acoustic phonons and optical phonons on the heat transport. Calculations are in good agreement with experimental results.