A bimodal magnetic force microscopy (MFM) that uses an external magnetic field for the detection and imaging of magnetic thin films is developed. By applying the external modulation magnetic field, the vibration of a cantilever probe is excited by its magnetic tip at its higher eigenmode. Using magnetic nanoparticle samples, the capacity of the technique which allows single-pass imaging of topography and magnetic forces is demonstrated. For the detection of magnetic properties of thin film materials, its signal-to-noise ratio and sensitivity are demonstrated to be superior to conventional MFM in lift mode. The secondary resonance MFM technique provides a promising tool for the characterization of nanoscale magnetic properties of various materials, especially of magnetic thin films with weak magnetism.