X-ray photoemission electron microscopy (X-PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X-PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X-PEEM

The magnetic coupling between epitaxial single-crystalline Co and FeMn layers on Cu(001) was investigated by element-resolved magnetic circular dichroism domain imaging using a photoelectron emission microscope. As-grown Co domain patterns reveal the presence of many small domains in the antiferromagnet. The coupling of the Co layer is found to be along <100> crystallographic directions. This is discussed in terms of a 45degrees coupling due to frustrations at topological 90degrees domains in the FeMn layer. Coercivity oscillations as a function of FeMn thickness with atomic monolayer period support the importance of such step-induced domains in the coupling

Using photoemission electron microscopy in combination with x-ray magnetic circular dichroism, element selective magnetic domain images have been obtained from single-crystalline Co/FeMn and FeMn/Co bilayers epitaxially grown on a Cu(001) single crystal. The contact with ferromagnetic Co leads to the observation of a net magnetic moment in Fe and Mn, independently of the paramagnetic or antiferromagnetic state of the FeMn thin films. Only a small fraction of this moment might mediate the magnetic interaction at the interface, and thus be responsible for the exchange bias effect

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