No abstract

We prepared ytterbium and silver co-doped tantalum-oxide (Ta2O5:Yb,Ag) thin films using a simple co-sputtering method and evaluated photoluminescence (PL) properties of the films after annealing. We found that a PL peak at a wavelength of 980 nm due to Yb3+ can be strongly enhanced by Ag doping. From X-ray diffraction measurements, we found that Ag2Ta8O21 and orthorhombic Ta2O5 crystalline phases are very important in order to enhance the 980-nm peak observed from our Ta2O5:Yb,Ag thin films. Because of the human-body transmittability of the 980-nm wavelength, such films are applicable to a novel real-time X-ray dosimeter system.

We fabricated europium and silver co-doped tantalum-oxide (Ta 2 O 5 :Eu, Ag) thin films using a simple co-sputtering method for the first time, and we evaluated their photoluminescence (PL) and X-ray diffraction (XRD) properties. We found that the most remarkable PL peak at a wavelength of 615 nm due to Eu 3+ can be enhanced by Ag doping, and the strongest PL peak can be obtained from a Ta 2 O 5 :Eu, Ag thin film after annealing at 1000˚C. Based on XRD measurements, we found that Ag 2 Ta 8 O 21 crystalline phases produced by Ag doping are very important and Eu 3 TaO 7 phases should be avoided in order to enhance the objective PL peak from our Ta 2 O 5 :Eu, Ag thin films.

No abstract

No abstract