A dynamic transmission electron microscope (DTEM) has been designed and implemented to study structural dynamics in condensed matter systems. The DTEM is a conventional in situ transmission electron microscope (TEM) modified to drive material processes with a nanosecond laser, “pump” pulse and measure it shortly afterward with a 30-ns-long probe pulse of ∼107 electrons. An image with a resolution of <20nm may be obtained with a single pulse, largely eliminating the need to average multiple measurements and enabling the study of unique, irreversible events with nanosecond- and nanometer-scale resolution. Space charge effects, while unavoidable at such a high current, may be kept to reasonable levels by appropriate choices of operating parameters. Applications include the study of phase transformations and defect dynamics at length and time scales difficult to access with any other technique. This single-shot approach is complementary to stroboscopic TEM, which is capable of much higher temporal resolution but is restricted to the study of processes with a very high degree of repeatability.

Although recent years have seen significant advances in the spatial resolution possible in the transmission electron microscope (TEM), the temporal resolution of most microscopes is limited to video rate at best. This lack of temporal resolution means that our understanding of dynamic processes in materials is extremely limited. High temporal resolution in the TEM can be achieved, however, by replacing the normal thermionic or field emission source with a photoemission source. In this case the temporal resolution is limited only by the ability to create a short pulse of photoexcited electrons in the source, and this can be as short as a few femtoseconds. The operation of the photo-emission source and the control of the subsequent pulse of electrons (containing as many as 5 x 10 7 electrons) create significant challenges for a standard microscope column that is designed to operate with a single electron in the column at any one time. In this paper, the generation and control of electron pulses in the TEM to obtain a temporal resolution <10-6 s will be described and the effect of the pulse duration and current density on the spatial resolution of the instrument will be examined. The potential of these levels of temporal and spatial resolution for the study of dynamic materials processes will also be discussed.