Thermoelectric power factor enhancement through thermal management with resonant level effect is experimentally demonstrated in SiGeAu composite system.
We propose the methodology for thermoelectric power factor
enhancement using nanoscale thermal management. The thermally managed
composite is composed of a high electrical conductivity (σ)
material with high thermal conductivity (κ), and a high Seebeck
coefficient (S) material with lowered κ
by nanostructuring, where a large temperature difference is applied
to high-S materials. This brings out two better properties
(high S and high σ) from the two different
materials. We experimentally demonstrate that S
2σ is enhanced in SiGe-Au composites compared with SiGe
materials, where SiGe is used as a high-S material
with low κ in Si-based materials and Au is used as a high-σ
material with high κ. Therein, the nanostructured Ge-rich domains
including Au with Ge nanocrystals form and work as a high-S and ultra-low-κ material. This SiGe-Au composite
achieves the highest S
2σ value
(22 μW cm–1 K–2) among reported
SiGe-related bulk materials (Ge fraction: 10–80%) at room temperature.
This methodology would be expected as a guideline for thermoelectric
performance enhancement.
Thin film thermoelectric materials have drawn much attention for realizing one-chip stand-alone power sources of Internet of Things devices. Here, we fabricate two types of the nanostructured Si films with high crystallinity: Si films containing β-FeSi 2 nanodots with a wider nanodot size distribution of ∼5-120 nm and Si films containing α-FeSi 2 nanodots with a narrow size distribution of ∼5-20 nm. The thermal conductivity of these films is lower than those of Si-silicide nanocomposite bulks. Interestingly, Si films containing β-FeSi 2 nanodots show about two times lower thermal conductivity than Si films containing α-FeSi 2 nanodots. This is because the widely-size-distributed β-FeSi 2 nanodots can effectively work as phonon scattering centers due to hierarchical architectures. These films also exhibited a high power factor due to the small amount of point defects and single crystalline epitaxial interfaces, regardless of the iron silicide phase of nanodots. These detailed investigations will open a road for realizing high-performance thin film thermoelectric materials.
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