This paper proposes a novel Built-in Self Calibration (BISC) technique for a 12-bit 32MS/s successive approximation register (SAR) analog-to-digital converter (ADC) using a single input to reduce the capacitor mismatch of the digital-to-analog converter (DAC) and to compensate the comparator input offset voltage. The proposed self-calibration scheme optimize the mismatch of the DAC by changing additional auxiliary capacitor array during calibration mode. In addition, in order to minimize the offset voltage of the comparator in the SAR ADC, a simplified voltage amplifier is proposed. The controller for the proposed algorithm operates as foreground operation to achieve low power consumption during operation. Compared to the converters that use the conventional procedure, INL and DNL are reduced by about 47% and 52%, respectively. The prototype was designed using 130nm single poly 6 metal standard CMOS technology. The ADC achieves a SNDR of 65.6 dB and consumes 4.62 mW. The ADC core occupies an active area of only 240μmÍ 298 μm using 1.2V supply and the sampling rate of 50 MS/s.

In this paper, a 12-bit high resolution, power and area efficiency hybrid digital pulse width modulator (DPWM) with process and temperature (PT) calibration has been proposed for digital controlled DC-DC converters. The hybrid structure of DPWM combines a 6-bit differential tapped delay line ring-mux digital-to-time converter (DTC) schema and a 6-bit counter-comparator DTC schema, resulting in a power and area saving solution. Furthermore, since the 6-bit differential delay line ring oscillator serves as the clock to the high 6-bit counter-comparator DTC, a high frequency clock is eliminated, and the power is significantly saved. In order to have a simple delay cell and flexible delay time controllability, a voltage controlled inverter is adopted to build the deferential delay cell, which allows fine-tuning of the delay time. The PT calibration circuit is composed of process and temperature monitors, two 2-bit flash ADCs and a lookup table. The monitor circuits sense the PT (Process and Temperature) variations, and the flash ADC converts the data into a digital code. The complete circuits design has been verified under different corners of CMOS 0.18um process technology node.