This paper presents the results of research on photon reflection from plane targets based on Monte Carlo simulations performed by the MCNP code. Five materials (water, concrete, aluminum, iron, and copper) are examined in the area of initial photon energies of up to 200 keV. The values of the total number albedo for photons dependent on the initial photon energy or the mean number of photon scatterings are calculated and graphically presented. We have shown that the values of the total number albedo for different target materials, expressed as a function of the mean number of photon scatterings, are in good agreement with each other and can be approximated by simple, universal analytic functions obtained by the least squares method. The accuracy of these analytic appoximations is confirmed by their comparison with the results of PENELOPE and FOTELP Monte Carlo codes

This pa per pres ents the re sults of the anal y ses of pho ton re flec tion from pla nar tar gets for nor mal pho ton in ci dence and for dif fer ent shield ing ma te ri als (wa ter, con crete, alu mi num, iron, and cop per), in the range of the ini tial pho ton en er gies from 20 keV to 300 keV. Cal cu lations of pho ton re flec tion pa ram e ters based on the re sults of Monte Carlo sim u la tions of the pho ton trans port have been per formed us ing MCNP4C code. In te gral re flec tion co ef fi cients, pre sented as func tions of the ra tio of to tal cross-sec tion of pho tons and ef fec tive atomic number of tar get ma te rial, show uni ver sal be hav iour for all the ana lysed shield ing ma te ri als in the se lected en ergy do main.

In this paper we present the results of calculations and analyses of the integral particle reflection coefficient of photons for oblique photon incidence on planar targets, in the domain of initial photon energies from 100 keV to 300 keV. The results are based on the Monte Carlo simulations of the photon reflection from water, concrete, aluminum, iron, and copper materials, performed by the MCNP code. It has been observed that the integral particle reflection coefficient as a function of the ratio of total cross-section of photons and effective atomic number of target material shows universal behavior for all the analyzed shielding materials in the selected energy domain. Analytical formulas for different angles of photon incidence have been proposed, which describe the reflection of photons for all the materials and energies analyzed.