This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given

In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results