The detection and quantification of hydrogen is becoming increasingly important in research on electronic materials and devices, following the identification of the hydrogen content as a potent control parameter for the electronic properties. However, establishing quantitative correlations between the hydrogen content and the physical properties of solids remains a formidable challenge. Here we report neutron reflectometry experiments on 50 nm thick niobium films during hydrogen loading, and show that the momentum-space position of a prominent waveguide resonance allows tracking of the absolute hydrogen content with an accuracy of about one atomic percent on a timescale of less than a minute. Resonance-enhanced neutron reflectometry thus allows fast, direct, and non-destructive measurements of the hydrogen concentration in thin-film structures, with sensitivity high enough for real-time in-situ studies.

We have investigated the structural, magnetic and superconduction properties of [Nb(1.5 nm)/Fe(x)]10 superlattices deposited on a thick Nb(50 nm) layer. Our investigation showed that the Nb(50 nm) layer grows epitaxially at 800 °C on the Al2O3(1−102) substrate. Samples grown at this condition possess a high residual resistivity ratio of 15–20. By using neutron reflectometry we show that Fe/Nb superlattices with x < 4 nm form a depth-modulated FeNb alloy with concentration of iron varying between 60% and 90%. This alloy has weak ferromagnetic properties. The proximity of this weak ferromagnetic layer to a thick superconductor leads to an intermediate phase that is characterized by a suppressed but still finite resistance of structure in a temperature interval of about 1 K below the superconducting transition of thick Nb. By increasing the thickness of the Fe layer to x = 4 nm the intermediate phase disappears. We attribute the intermediate state to proximity induced non-homogeneous superconductivity in the structure.

The nondestructive investigation of electronic and magnetic modifications at buried interfaces contributes significantly to the understanding of the underlying interactions. This knowledge is essential for the design of electronic devices based on complex quantum materials. Herein, the application of resonant X‐ray and neutron reflectometry for the study of perovskite transition metal oxide heterostructures is reviewed. Both methods are well suited for the nondestructive study of interfacial reconstructions and interactions of spin, charge, and orbitals at the nanoscale. Herein, cases are highlighted in which both methods are complementary and thus provide unique insights into the physics of oxide heterostructures.