Ag doped ZnO microrods are prepared on c-plane sapphire substrates by chemical vapour deposition method at high temperature.The morphology, structure and optical properties were investigated by scanning electron microscopy, X-ray diffraction and Raman spectrum, respectively. The prepared Ag doped ZnO microrods have good preferred orientation with very limited structural defects. The Raman bands indicates that a tensile stress existed in the sample and an additional local vibrational mode related to Ag is also found which can be used to confirm the existence of Ag in the Ag doped ZnO microrods.

Because of the different melting point, it is difficult to doped Ag element in ZnO film. Ag dopant can adjust the properties of ZnO materials. In this paper, we deposited Ag doped ZnO film using two step vapour evaporation method on c-plane sapphire substrate. The SEM image shows that the doped film was composed of small grain which compact in order and the Ag microwires was dispersed on the surface. The EDX graph proves that the Ag was indeed in the film. The XRD pattern reveals that the doped film has prefer orientation along the c-axis with wurtzite structure and the dopants have not effect the crystal quality.