We are investigating a method for identifying materials from a distance, even when they are obscured, using a technique called Quantum Parametric Mode Sorting and single photons detection. By scanning a segment of the material, we are able to capture data on the relationships between the peak count of photons reflected at each position and the location of that reflection. This information allows us to measure the relative reflectance of the material and the texture of its surface, which enables us to achieve a material recognition accuracy of 99%, even maintaining 89.17% when materials are obscured by a lossy and multi-scattering obscurant that causes up to 15.2 round-trip optical depth.