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With a two-crystal vacuum spectrometer, ionization curves of the Kaz, 4 group of x-ray satellite lines have been recorded for elements S(16) to Ge(32). In the i£a 3 , 4 satellite group are found five component lines for 16^Z^28 and four components for 29^Z^32. The wave-length position, relative intensity, and line width at half-maximum intensity of each satellite component has been measured. The widths and shapes of the Ka\ t 2 lines were determined and a brief discussion of these data is given.

The technique of the total reflection of x rays has been applied to the study of thin films of Cu, Ni, Ge, and Se vacuum-deposited onto polished glass substrates. Starting with fresh films, ``smooth'' enough to exhibit pronounced x-ray interference fringes in the region just beyond the critical angle, the effects of vacuum anneal and oxidation were studied. Changes in the reflection curves are interpreted in terms of possible structural changes in the films. Reflection from layers of particles of carbon or polystyrene latex deposited onto ``smooth'' substrates was also studied for comparison.