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A technique is proposed for determining beam dimensions on a target by measuring two-dimensional angular distributions of the radiation for two distances between the crystal where the radiation is generated and a coordinate detector. The dimensions are determined from the results of a least squares method procedure with varying parameters, where the adjustable function is the distribution for a shorter distance and the fitting function is the convolution of the angular distribution at a greater distance with a twodimensional Gaussian distribution whose parameters are uniquely related to the beam dimensions on the target and the distances between the crystal and the detector. The minimum measured beam sizes are about 50-60 μm for the parametric x-ray mechanism and an electron energy of less than 1 GeV and 10-15 μm for the mechanism of diffracted transition radiation and electrons with an energy above several GeV.

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Measurements of an electron beam parameters a b s t r a c tUsing the previously proposed method of calculating diffracted photon yields in thin perfect crystals, analyzed a relative contribution of parametric X-ray radiation and diffracted photons in thin crystals. It is shown that for average energy of electrons and the center of the PXR spot diffracted real photon contribution is comparable to the yield of parametric X-ray radiation and determines the shape of the angular distribution of the total emission in this range of observation angles. The possibility of estimating electron beams parameters based on the results of PXR angular distribution measurements is discussed. It is shown that for energy of electrons by far larger than 1 GeV yield of diffracted transition radiation in narrow angular cone becomes predominating and determines the shape of the angular distribution of total emission in the center of radiation spot.Ó 2015 Published by Elsevier B.V.