A result of the imaging of two rhenium tips by means of field‐ion microscopy is presented. In both the cases the obtained field‐ion pattern is different from that of the final field‐evaporation form of rhenium and showed bright contours of image spots around the {100} poles of the (110)‐oriented rhenium tips. The rearranged pattern is believed to be due to the presence of traces of active gases and the high electric field in the field‐ion microscope. An explanation is given in terms of the borken bonds model. The high brightness of the contours is assumed to have the same mechanism as the effect of the 〈100〉 zone line decorations of rhenium. An adsorption specifity is assumed of the rhenium surface regions close to certain critical zone lines that correspond to the first‐nearest neighbour non‐basal bonds.

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