In this paper, a new sensor system for relative humidity measurements based on its interaction with the evanescent field of a nanowire is presented. The interrogation of the sensing head is carried out by monitoring the fast Fourier transform phase variations of one of the nanowire interference frequencies. This method is independent of the signal amplitude and also avoids the necessity of tracking the wavelength evolution in the spectrum, which can be a handicap when there are multiple interference frequency components with different sensitivities. The sensor is operated within a wide humidity range (20%-70% relative humidity) with a maximum sensitivity achieved of 0.14rad/% relative humidity. Finally, due to the system uses an optical interrogator as unique active element, the system presents a cost-effective feature.

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We have implemented an exact ray trace through a plano-freeform surface for an incident plane wavefront. We obtain two caustic surfaces and provide the critical points related to the ray tracing process. Additionally, we study the propagation of the refracted wavefronts through the plane-curved surface. Finally, by using the Ronchi-Hartmann type null screen and placing the detection plane within the caustic region, we have evaluated the shape of a plano-freeform optical surface under test, obtaining an RMS difference in sagitta value of 6.3 μm.