An algorithm for object identification on the color images ofintegrated circuit layout is proposed. The layout image is represented as set ofpicture areas that have slightly different conditions ofphotographing. The identification algorithm based on segmentation and twosteps image filtration using mathematical morphology and semantic approach. It can be appliedfor the tasks of integrated circuits redesign and automated visual inspection of integrated circuits and photomask production
Рассматриваются архитектура нейронной сети “неокогнитрон” в задачах поиска структурных элементов на полутоновых изображениях интегральных схем. Предлагается модифицированное правило активации нейронов инвариантное к искажениям яркости изображения. Сравнительные результаты применения нейронной сети показали преимущество использования нейросетевого подхода.
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