Abstract. Epitaxial buffer layers of CeO 2 and Yttria-stabilized ZrO 2 (YSZ) have been deposited on biaxially textured nickel substrates using reel to reel thermal reactive evaporation, and rf sputtering. The degree of texture of the deposited buffer layers were analysed by X-ray pole figure, Out-of-plane (w-scan) and in-plane (Φ-scan) texture. The Microstructures of oxide buffer layer was determined by electron backscattering diffraction (EBSD) partially and SEM in selected marked area, providing information on the propagation of the grain boundary network from the substrate to the buffer layers in the same expected area. The oxide layer sequence, YBCO/CeO 2 /YSZ/CeO 2 /NiW was the same in each sample, but different deposition techniques were used to deposit the YBa 2 Cu 3 O 7 films: MOCVD, PLD, and DC-sputtering. Transport measurements on the coated conductor samples were measured 1.2 MA/cm 2 , and 1.0 MA/sm 2 , 1.8 MA/cm 2 at 77 K (0 T) respectively.