A method for fast measurement of Q factors for dielectric resonators using a computer-simulated Smith chart is presented. The method can be incorporated into a larger computer-aided design system for design of microwave integrated circuits. It is based on computing the bandwidth from the interception of the reflection coefficient locus at the resonant frequency with the R − 1 = ±jX arcs. Measurements of the Q factor are performed by programming the system to calculate the frequency shifts required to obtain the corresponding reflection coefficient angles at these interception points. An accuracy of 2% is achieved in Q-factor measurement for a number of X-band resonators.

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