Cetylpyridinium chloride, a cationic surfactant, adsorbs at a
silica/water interface, forming double-layer
structures which coadsorb salicylate ions below the equilibrium
critical micelle concentration (cmc) as the
result of strong interactions between the surfactant head-group and the
aromatic anion. Above the cmc
the salicylate ions are distributed between adsorbed surfactant
aggregates, free micelles, and water. Using
a simple pseudophase formalism, ion partition coefficients are
calculated in dilute solutions as ratios of
bound to free salicylate concentrations for the various adsorbed or
free surfactant structures. It is shown
that the salicylate coadsorption ion partition coefficient decreases as
the pH increases above the silica
isoelectric point. The partition coefficient is larger for the
adsorbed aggregates than for the free micelles
at low (acidic) pH but is equal to the latter values at higher
(alkaline) pH values. On the basis of a previous
investigation on neutral solutes in the same silica/surfactant system,
the following interpretation of these
observations is suggested. At low pH values, salicylate ions form
complexes with the cationic head-groups
of both surfactant layers: the inner layer with the head-groups
facing the silica surface and the outer-layer
facing the bulk of the solution. At higher pH values, salicylate
ions are repelled from the inner layer by
the high negative surface charge density on the silica particles.
As a consequence only the surfactant outer
layer complexes the aromatic anions. This configuration is closer
to that of free micelles, hence, the
decrease of the salicylate partition coefficients and the similar
partion coefficient values for the aromatic
anion for both types of adsorbed and free surfactant structures.
Additional evidence is provided by the
behavior of sodium naphthoate and 2-4-6-trichlorophenol in the same
chemical systems.
Counterion condensation data have been obtained from potentiometric measurements for mixed micelles of copper dodecyl sulfate with two nonionic surfactants, Triton X-100 (system I) and Brij 35 (system II), by using a highly sensitive cupric ion selective electrode. A critical micellar composition X™ value is determined beyond which cupric counterions do not condensate on the mixed micelles. XM values are equal to 0.98 (system I) and 0.95 (system II). These results are discussed in terms of Bjerrum's ion-ion association model. The relevance of these findings to the recently observed increase of cloud point phenomena of nonionic surfactants upon addition of small quantities of an anionic surfactant is outlined.
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