Measurement images of solar cells contain information about their material‐ and process‐related quality beyond current–voltage characteristics. This information is currently only partially used because most algorithms look for human‐defined image features or defects. Herein, a purely data‐driven method is proposed to derive the essential image information in terms of the electrical quality within a comprehensive and meaningful representation. This representation is denoted as the empirical digital twin of the cell. Using it, solar cells can be classified according to their defects visible in the measurement images. For this purpose, a human‐in‐the‐loop approach to efficiently develop a classification scheme is presented. Therefore, a convolutional neural network combining various measurement data of a sample by correlating them with quality parameters is designed. The digital twin is an intermediate representation of the network capturing the quality‐relevant defect signatures from the images. Human experts can analyze this representation space to identify defect clusters that relate to different process errors, such as finger interruptions and shunts. How the representations are usable to derive sorting criteria for quality inspection is shown. Finally, how the empirical digital twin and the sorting scheme can be used for segmenting the defects without additional label effort is demonstrated.

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