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Scaling relations describing the electromagnetic behaviour of coated conductors (CCs) greatly simplify the design of REBCO-based devices. The performance of REBCO CCs is strongly influenced by fabrication route, conductor architecture and materials, and these parameters vary from one manufacturer to the others. In the present work we have examined the critical surface for the current density, Jc(T,B,), of coated conductors from six different manufacturers: American Superconductor Co. (US), Bruker HTS GmbH (Germany), Fujikura Ltd. (Japan), SuNAM Co. Ltd. (Korea), SuperOx ZAO (Russia) and SuperPower Inc. (US). Electrical transport and magnetic measurements were performed at temperatures between 4.2 K and 77 K and in magnetic field up to 19 T.Experiments were conducted at three different orientations of the field with respect to the crystallographic c-axis of the REBCO layer, θ = 0°, 45° and 90°, in order to probe the angular anisotropy of Jc. In spite of the large variability of CCs' performance, we show here that field and temperature dependences of Jc at a given angle can be reproduced over wide ranges using a scaling relation based only on three parameters. Furthermore, we present and validate a new approach combining magnetic and transport measurements for the determination of the scaling parameters with minimal experimental effort.

Single-core MgB2 composite wires have been made by the powder-in-tube method using commercial Mg, B and MgB2 powders (Alfa Aesar) in Fe, Nb and Ta tubes and both in situ and ex situ processes. Prepared wires were subjected to annealing at temperatures ranging from 600 °C up to 950 °C for 30 min in argon atmosphere. Resistive (R(T)) and transport current (Ic(μ0H)) measurements have shown how the sheath material that was used influences the critical temperature and critical current density. Inter-diffusion and reaction has been observed only for the iron sheath. Niobium has appeared as the best sheath material for MgB2 wires made by the in situ process but as the worst sheath material for the ex situ method. The reason is mainly due to the large transversal cracks generated in the fully Nb sheathed ex situ wires during the deformation, which are not healed by the subsequent heat treatment.

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