Stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is one of the most damaging diseases of wheat worldwide. It is essential to identify new genes for effective resistance against the disease. Durum wheat PI 480148, originally from Ethiopia, was resistant in all seedling tests with several predominant Pst races in the US under controlled greenhouse conditions and at multiple locations subject to natural infection for several years. To map the resistance gene(s) and to transfer it to common wheat, a cross was made between PI 480148 and susceptible common wheat genotype Avocet S (AvS). Resistant F(3) plants with 42 chromosomes were selected cytologically and by testing with Pst race PST-100. A total of 157 F(4) plants from a single F(3) plant with 2n = 42 tested with PST-100 segregated in a 3 resistant: 1 susceptible ratio, indicating that a single dominant gene from PI 480148 conferred resistance. Using the F(3:4) population and the resistance gene-analog polymorphism (RGAP) and simple sequence repeat (SSR) markers, the gene was mapped to the long arm of chromosome 2B. SSR marker Xwmc441 and RGAP marker XLRRrev/NLRRrev ( 350 ) flanked the resistance gene by 5.6 and 2.7 cM, respectively. The effective resistance of the gene to an Australian Pst isolate virulent to Yr5, which is also located on 2BL and confers resistance to all US Pst races, together with an allelism test of the two genes, indicated that the gene from PI 480148 is different from Yr5 and should be a new and useful gene for resistance to stripe rust. Resistant common wheat lines with plant types similar to AvS were selected for use in breeding programs.

Sexual reproduction of the stem rust pathogen, Puccinia graminis f. sp. tritici (Pgt), on barberry (Berberis vulgaris) has been shown to provide initial inoculum for the development of the disease on wheat and barley and also generate diverse races of the pathogen. However, in our previous study, the stripe rust pathogen, P. striiformis f. sp. tritici (Pst), was not found on barberry in the U. S. Pacific Northwest. To determine why Pgt is able to infect the alternate host, while Pst cannot under the natural conditions, the viabilities of teliospores of both Pgt and Pst were investigated from 2011 to 2014 by determining the germination rates using telial samples collected periodically from wheat fields. Teliospores of Pst usually produced in July were physically degraded during winter, and their germination rate decreased from 50 to 90% in August to less than 1% in the following March and no germination after May. In contrast, Pgt teliospores usually produced in July and August remained physically intact and physiologically dormant, and could not germinate until February. Germination of Pgt teliospores gradually increased to 90% in May, at which time young leaves of barberry were susceptible to infection. In addition, a time-series experiment was conducted for inoculation of barberry plants with Pst teliospores. The results showed that Pst teliospores need a minimum of 32 h continual dew-forming conditions to infect barberry, and infection reaches a peak after incubation of inoculated plants for 88 h. The lack of a prolonged period of leaf wetness conditions during the season of telial maturity effectively negates Pst infection of barberry plants in the Pacific Northwest.

This manuscript reports two new genes ( Yr64 and Yr65 ) for effective resistance to stripe rust and usefulness of their flanking SSR markers for marker-assisted selection. Stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is one of the most important diseases of wheat worldwide and resistance is the best control strategy. Durum wheat accessions PI 331260 and PI 480016 were resistant to all tested Pst races. To transfer the resistance genes to common wheat and map them to wheat chromosomes, both accessions were crossed with the stripe rust-susceptible spring wheat 'Avocet S'. Resistant F3 plants with 42 chromosomes were selected cytologically and by rust phenotype. A single dominant gene for resistance was identified in segregating F4 lines from each cross. F6 populations for each cross were developed from single F5 plants and used for genetic mapping. Different genes from PI 331260 and PI 480016 were mapped to different loci in chromosome 1BS using simple sequence repeat markers. The gene from PI 331260 was flanked by Xgwm413 and Xgdm33 in bin 1BS9-0.84-1.06 at genetic distances of 3.5 and 2.0 cM; and the gene from PI 480016 was flanked by Xgwm18 and Xgwm11 in chromosome bin C-1BS10-0.50 at 1.2 and 2.1 cM, respectively. Chromosomal locations and race and allelism tests indicated that the two genes are different from previously reported stripe rust resistance genes, and therefore are named as Yr64 from PI 331260 and Yr65 from PI 480016. These genes and their flanking markers, and selected common wheat lines with the genes should be valuable for diversifying resistance genes used in breeding wheat cultivars with stripe rust resistance.

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This manuscript reports a new gene for non-race-specific resistance to stripe rust and molecular markers for incorporating it into wheat cultivars for control of the disease with durable resistance. Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive wheat diseases worldwide. The spring wheat germplasm 'PI 178759' originating from Iraq showed effective resistance to stripe rust in field evaluations over 8 years in Washington state, USA. To map the resistance gene(s), PI 178759 was crossed with 'Avocet Susceptible', and the parents and 176 F2:3 lines were phenotyped in the fields under natural infection and in a greenhouse with selected races of P. striiformis f. sp. tritici. PI 178759 was identified to have high-temperature adult-plant (HTAP) resistance. Resistance gene analog polymorphism and simple sequence repeat techniques were used to identify molecular markers linked to the resistance gene and a chromosome region was mapped using a quantitative trait locus approach. One major gene was mapped to the long arm of chromosome 7B. Flanked by Xwgp5175 and Xbarc32 in a 2.1 cM region, the gene explained 31.8 and 54.7 % of the phenotypic variation in rAUDPC and IT, respectively. Based on genetic distances among markers and allelism tests, the HTAP resistance gene in PI 178759 is different from the previously reported Yr39, Yr52, YrZH84, and YrC591, also located on chromosome 7BL, and is therefore designated as Yr59. The gene and its flanking markers should be useful for developing wheat cultivars with durable resistance.