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National Institute of Science and Technology (NIST) silicate glass SRM 610 is widely used as a certified reference material for various micro‐analytical techniques such as SIMS or laser ablation ICP‐MS. SRM 610 has been nominally doped with sixty one trace elements at the 500 μg g−1 level, but certified concentration data exist for only a few of these elements. This study reports concentration data for fifty nine trace elements obtained by ICP‐MS, SSMS, LIMS, TIMS, INAA, AAS, and PIXE analyses of two different SRM 610 wafers. Most elements fall within a 10% band around a median value of about 440 μg g−1. The REE concentrations are shown to be constant to 3% (1 σ), thus emphasizing the value of SRM 610 as a reference material for REE analyses. Comparison of our values with published data suggests that different SRM 610 wafers are, within errors, chemically identical for most elements. Exceptions to this general rule appear to be restricted to elements which were partly lost during the production of the glass, e.g. Ag and Br. On the basis of six independent determinations of Rb concentrations, which are systematically lower by a few percent than the reported NIST value, we argue that the certified Rb concentration may not be representative for all distributed SRM 610 wafers.

Spark source mass spectrometry (SSMS) has experienced important and significant improvements in nearly all analytical features by the use of a multiple ion counting (MIC) system. Two procedures have recently been developed to further increase the analytical capabilities of MIC-SSMS in geochemistry. These are a mathematical correction of interferences, which is often necessary for the ultra trace element analysis of Nb, Ta, Zr, Hf and Y, and the development of an autospark system to hold the total ion beam constant. New analytical data for geological samples, especially international reference materials, are presented using the improved MIC-SSMS technique. The data set consists of high precision and low abundance data for Zr, Nb and Y in depleted reference materials. The MIC-SSMS results are compared with those of conventional SSMS using photoplates for ion detection. The precision of the MIC-SSMS isotope ratio measurements (about 1%) is more than a factor of 3 better than that of conventional SSMS, as demonstrated by analyses of Hawaiian samples. Total uncertainties of MIC-SSMS concentration data including all sources of error are generally between 2 and 5% for concentrations higher than about 0.3 microg/g and about 10% for trace element abundances in the ng/g range.

The concentrations of Fe, Ni, Co, P, Cu, Ga, Ge, Mo, Ru, Rh, Pd, W, Ir and Pt in the phosphides and the metal of the coarse octahedrites Campo del Cielo, Canyon Diablo, Cranbourne and Sardis, the coarsest octahedrite Säo Juliäo de Moreira and the hexahedrites Braunau and Lombard have been determined by spark source mass spectrometry. Striking differences are observed of the element contents between bulk meteorite and the phosphides as well as between the different phosphide modifications schreibersite and rhabdite. Extreme values are a 20 fold depletion of Ga and a 40 times higher content of Pd in the phosphides. A particularly strong correlation between the noble metal element content and size of phosphide aggregates is observed; it is shown that this correlation is not an artifact of the sample preparation but that is must be real.

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