To date, the American Society for Testing and Materials (ASTM) is the criteria widely used at the semiconductor industry wherein the minimum ball shear test requirement is based on the wire diameter. Lately, another standard was introduced in the business, the Automotive Electronic Council (AEC) standard which prescribd a minimum shear reading for a corresponding ball diameter produced.In line with this, this paper presents the characterization made on attributes which could affect the ball formation and shear test results. Moreover, a stucfy was conducted to determine the running capability on ball diameter size and ball shear test readings with respect to ASTM and AEC standards.