In order to improve the reliability of down-hole electronics Quartzdyne Electronics has invested over 10 million device test hours in life testing of our circuits in both powered and un-powered modes. In addition to time at temperature, these tests include thermal cycling and high impact drop testing. While resistors tend to be generally reliable, we have observed resistance drift in some units that has pushed circuit performance outside of accepted electrical specifications. In an attempt to comprehend the root cause(s) of resistance drift, failed samples have been studied in a scanning electron microscope. The resulting observations have led to structured designs of experiment to isolate the many possible root causes. This paper will present these observations, experimental outcomes and draw conclusions surrounding thick film vs. thin film performance, variations between value ranges, differences between vendors, and a possible link relating the drift mechanism to the method and extent of value trimming. This information should be useful to resistor vendors interested in improving the quality and performance of their products.