No abstract

The influence of technological factors for obtaining such as both time and temperature of evaporator and temperature of substrate on statistics of the objects on the surface of PbTe films doped by Bi and deposited from the vapor on ceramics substrate in vacuum has been investigated. The atomic force microscopy, the image processing techniques and testing of the statistical hypotheses were used. The influence of technological factors on statistics of the surface crystallite size and their correlation to each other was analyzed.

The influence of technological factors for obtaining such as both time and temperature of evaporator and temperature of substrate on statistics of the objects on the surface of PbTe films doped by Bi and deposited from the vapor on ceramics substrate in vacuum has been investigated. The atomic force microscopy and the image processing techniques and testing of statistical hypotheses were used. The influence of technological factors on statistics of the surface crystallite size and their correlation to each other was analyzed.