Articles you may be interested inLuminescence properties and scintillation response in Ce3+-doped Y2Gd1Al5-xGaxO12 (x = 2, 3, 4) single crystals J. Appl. Phys. 116, 083505 (2014); 10.1063/1.4893675Yttrium antisite reduction and improved photodiode performance in Ce doped Y3Al5O12 by Czochralski growth in alumina rich melts Czochralski growth of cerium-doped Lu 1.8 Y 0.2 SiO 5 ͑LYSO͒ from a 90/10 solution of Lu 2 SiO 5 ͑LSO͒ and Y 2 SiO 5 ͑YSO͒ is demonstrated. The alloyed scintillator retains the favorable growth properties of YSO and the desirable physical and optical scintillator properties of LSO. Radioluminescence, thermally stimulated luminescence, optical absorption, and lifetime measurements confirm the equivalence of LYSO and LSO optical properties. Advantages of LYSO Czochralski growth relative to LSO include reduced melting point, less propensity for formation of crystalline inclusions, lower cost of starting material, and easier incorporation of cerium into the host lattice. This material offers an attractive alternative to LSO for scintillator applications.

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Impressive data sets have been produced for 316H stainless steel (18Cr-12Ni-Mo with up to 0.08C) by the National Institute for Materials Science (NIMS), Japan, to reveal the dependencies on stress and temperature of the high-temperature creep and creep fracture behaviour of nine batches of tube, six of bar and two of plate. Using these long-term property values, the stresses to produce failure in 100,000h at various plant exposure temperatures have been determined using the Manson-Haferd parameter. However, by incorporating the 0.2% proof stresses and ultimate tensile strengths of each batch of material at the creep temperatures, new relationships allow accurate prediction of the allowable tensile creep stresses using data from tests lasting only up to 5000h. Moreover, all of these results can be interpreted straightforwardly in terms of the dislocation processes controlling creep strain accumulation and the cavitation damage causing creep failure.

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