In this paper we analyze the capability of adaptive lenses to replace mechanical axial scanning in confocal microscopy. The adaptive approach promises to achieve high scan rates in a rather simple implementation. This may open up new applications in biomedical imaging or surface analysis in micro- and nanoelectronics, where currently the axial scan rates and the flexibility at the scan process are the limiting factors. The results show that fast and adaptive axial scanning is possible using electrically tunable lenses but the performance degrades during the scan. This is due to defocus and spherical aberrations introduced to the system by tuning of the adaptive lens. These detune the observation plane away from the best focus which strongly deteriorates the axial resolution by a factor of ~2.4. Introducing balancing aberrations allows addressing these influences. The presented approach is based on the employment of a second adaptive lens, located in the detection path. It enables shifting the observation plane back to the best focus position and thus creating axial scans with homogeneous axial resolution. We present simulated and experimental proof-of-principle results.

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We demonstrate a method to select different layers in a sample using a low coherent gating approach combined with a stable common-path quantitative phase imaging microscopy setup. The depth-filtering technique allows us to suppress the negative effects generated by multiple interference patterns of overlaying optical interfaces in the sample. It maintains the compact and stable common-path setup, while enabling images with a high phase sensitivity and acquisition speed. We use a holographic microscope in reflective geometry with a non-tunable low coherence light source. First results of this technique are shown by imaging the hardware layer of a standard micro-controller through its thinned substrate.

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Laser Fault Injection (LFI) is one of the most powerful methods of inducing a fault as it allows targeting only specific areas down to single transistors. The downside compared to noninvasive methods like introducing clock glitches is the largely increased search space. An exhaustive search through all parameters including dimensions for correct timing, intensity, or length might not be not feasible. Existing solutions to this problem are either not directly applicable to the fault location or require additional device preparation and access to expensive equipment. Our method utilizes measuring the Optical Beam Induced Current (OBIC) as imaging technique to find target areas like flip-flops and thus, reducing the search space drastically. This measurement is possible with existing laser scanning microscopes or well-equipped LFI setups. We provide experimental results targeting the Advanced Encryption Standard (AES) hardware accelerator of an Atmel ATXMega microcontroller.