-This paper describes the multithreaded MiraXT SAT Solver which was designed to take advantage of current and future shared memory multiprocessor systems. The paper highlights design and implementation details that allow the multiple threads to run and cooperate efficiently. Results show that in single threaded mode, MiraXT compares well to other state of the art solvers on Industrial problems. In threaded mode, it provides cutting edge performance, as speedup is obtained on both SAT and UNSAT instances.

This article describes PaMiraXT, a powerful parallel SAT algorithm. PaMiraXT follows a master/client model based on message passing, making it suitable for any kind of workstation cluster. For the clients, MiraXT is used, which itself is thread-based parallel solver designed to take advantage of current and future shared memory multiprocessor systems. We highlight design and implementation details that allow the threads/clients to run and cooperate efficiently. Experimental results show that MiraXT compares well to other state-of-the-art SAT algorithms. In single-threaded mode, it outperforms MiniSat2, PicoSAT 535, and RSat 2.01, while in multi-threaded mode, MiraXT provides cutting edge performance, as it solves significantly more instances within the given time limit. A case study, using three copies of MiraXT with a total of 8 threads as clients, underlines the potential of PaMiraXT, resulting in a speedup of 5.62 on the industrial benchmarks of the 2007 SAT competition.

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Efficient utilization of the inherent parallelism of multi-core architectures is a grand challenge in the field of electronic design automation (EDA). One EDA algorithm associated with a high computational cost is automatic test pattern generation (ATPG). We present the ATPG tool TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully chosen mix of various optimization techniques, multi-million-gate industrial circuits are handled without aborts. TIGUAN supports both conventional single-stuck-at faults and sophisticated conditional multiple stuck-at faults which allows to generate patterns for non-standard fault models. We demonstrate how TIGUAN can be combined with conventional structural ATPG to extract full benefit of the intrinsic strengths of both approaches.