Schlagwörter: Heterodyn-Verfahren, Laserinterferometer, Refraktometer, Umweltkompensation, Wegmeßsystem Es wird ein Zweifrequenz-Laserwegmeßsystem vorgestellt, welches speziell für den Einsatz in den schnellen Präzi-sionspositioniersystemen mikrolithografischer Großgeräte und der Ultrapräzisionstechnik entwickelt wurde. Die von einem hochstabilisierten He-Ne-Laser erzeugte Modulationsfrequenz von 640 MHz erlaubt im Zusammenhang mit einer neuartigen HF-Signalverarbeitung Verfahrgeschwindigkeiten von bis zu 6,3 m/s, ohne daß das kleinste Inkrement (5 nm) "verlorengeht." Ein weiterer, metrologischer Vorteil besteht darin, daß das kleinste Inkrement nicht, wie bisher üblich, durch eine zusätzliche NF-Interpolation erzeugt wird, sondern aus der Parallelverarbeitung im HF-Teil hervorgeht.A two-frequency laser interferometric path measuring system is introduced which has been developed especially for the precision rapid-positioning systems of microlithographic large-scale instruments and for ultra-precision technology. The modulation frequency of 640 MHz, generated by a highly-stabilized He-Ne laser allows -in combination with a novel HF signal processing method -measuring velocities up to 6.3 m/s without,,loosing" even the least increment (5nm). It is a further metrological merit that the least increment is not generated by an additional NF interpolation -as was usual so far -but arises from the parallel processing in the HF part.
Atwofrequency laser interferometric path measuring system is introduced which has been developed especially for the precision rapid-positioning systems of micro lithographic large-scale instruments and for ultra-precision technology. The modulation frequency of 640 MHz, generated by a highly-stabilised He-Ne-laser allows-in combination with a novel HF signal processing method -measuring velocities up to 6,4 m/s without "loosing" even the least increment (10 nm). It is a further metrological merit that the least increment is not generated by an additional NF interpolation-as was usual so far-but arises from the parallel processing in the HF part.
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