Atomic force microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument (AFM-IR) capable of producing sub-micrometer spatial resolution IR spectra and absorption images. This new capability enables the spectroscopic characterization of microdomain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyhexanoate) were solution cast on ZnSe prisms, followed by melting and annealing to generate crystalline microdomains of different sizes. A tunable IR laser generating pulses of the order of 10 ns was used for excitation of the sample films. Short duration thermomechanical waves, due to infrared absorption and resulting thermal expansion, were studied by monitoring the resulting excitation of the contact resonance modes of the AFM cantilever. Dramatic differences in the room-temperature IR spectra are observed in the 1200-1300 cm(-1) range as a function of position on a spatial scale of less than one micrometer. This spectral region is particularly sensitive to the polymer backbone conformation. Such dramatic spectral differences have also been observed previously in bulk IR measurements, but only by comparing room-temperature spectra with ones collected at higher temperatures. Less dramatic, but significant, AFM-IR spectral differences are observed in the carbonyl stretching region around 1720 cm(-1) as a function of location on the sample. Two overlapping, but relatively sharp, carbonyl bands are observed near 1720 cm(-1) in more crystalline regions of the polymer, while a broader carbonyl stretching band appears centered at 1740 cm(-1) in the more amorphous regions. Using this spectral region, it is possible to monitor the development of polymer crystalline structures at varying distances from a nucleation site, where the site was generated by bringing a heated AFM tip close to a specific location to locally anneal the sample.
Polymer/inorganic nanocrystal composites1–10 offer an attractive means to combine the merits of organic and inorganic materials into novel electronic and photonic systems. However, many applications of these composites are limited by the solubility11 and distribution of nanocrystals (NCs) in polymer matrices. Here, a high photoconductive gain has been achieved by blending cadmium telluride (CdTe) nanoparticles (NPs) into a polymer/fullerene matrix followed by a solvent annealing12 process. The NP surface capping ligand, N-phenyl-N’-methyldithiocarbamate, renders the NPs highly soluble in the polymer blend thereby enabling high nanocrystal loadings. An external quantum efficiency (EQE) as high as ~8000% (at 350nm) is reached at −4.5V. Hole-dominant devices coupled with AFM images are studied to uncover the probable mechanism. We observe a higher concentration of CdTe NPs is located near the cathode/polymer interface. These NPs with trapped electrons assist hole injection into the polymer under reverse bias, which contributes to greater than 100% EQE.
There is a significant need for chemical identification and chemical imaging of nanofabricated structures and devices, especially for multiple materials integrated at the nanometer scale. Here we present nanofabrication, chemical identification, and nanometer-scale chemical imaging of polymer nanostructures with better than 100 nm spatial resolution. Polymer nanostructures of polyethylene, polystyrene, and poly(3-dodecylthiophene-2,5-diyl) were fabricated by tip-based nanofabrication. Nanometer-scale infrared measurements using atomic force microscopy infrared spectroscopy (AFM-IR) obtained quantitative chemical spectra of these nanostructures. We show chemical imaging of intersecting patterns of nanometer-scale polymer lines of different chemical compositions. The results indicate that for closely packed heterogeneous nanostructures, the spatial resolution of AFM-IR is not limited by nanometer-scale thermal diffusion, but is instead limited by the cantilever sensitivity and the signal-to-noise ratio of the AFM-IR system.
Determining the extent of miscibility of amorphous components is of great importance for certain pharmaceutical systems, in particular for polymer-polymer and polymer-small molecule blends. In this study, the application of standard atomic force microscopy (AFM) measurements combined with nanoscale mid-infrared (mid-IR) spectroscopy was explored to evaluate miscibility in binary polymer blends. The miscibility characteristics of a set of 50/50 (w/w) polymer blends comprising of poly(vinylpyrrolidone) (PVP) with dextran or maltodextrin (DEX) of varying molecular weights (MWs) were investigated. Standard AFM characterization results show good agreement with inferences drawn from differential scanning calorimetry (DSC) analysis in terms of forming either single or two phase systems. AFM analysis also provided insight into the microstructure of the two phase systems and how domain sizes varied as a function of polymer MWs. Nanoscale mid-IR evaluation of the blends, performed by collecting local mid-IR spectra or spectral maps, provided an extra dimension of information about the dependence of polymer MWs on chemical composition of the different phases. AFM, combined with nanoscale mid-infrared analysis, thus appears to be a promising technique for the evaluation of miscibility in certain pharmaceutical blends.
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