In this work, we propose a new theoretical approach to modeling the electron-ion recombination processes in ionization tracks in liquid argon at 87 K. We developed a computer simulation method using realistic models of charge transport and electron-ion reactions. By introducing the concept of one-dimensional periodicity in the track, we are able to model very large cylindrical structures of charged particles. We apply our simulation method to calculate the electron escape probability as a function of the initial ionization density in the track. The results are in quantitative agreement with experiment for radiation tracks of relatively high ionization density. At low ionization densities, the simulation results slightly overestimate the experimental data. We discuss possible reasons for this disagreement and conclude that it can be explained by the role of δ tracks (short tracks of secondary electrons) in electron-ion recombination processes. We introduce an approximate model that takes into account the presence of δ tracks and allows the experimental data obtained from a liquid-argon ionization detector to be reproduced over a wide range of ionization density.

A simulation method is proposed to model electron-ion recombination in radiation tracks in liquid argon at 87 K. The method is applied to calculate the electron escape probability in clusters of up to 20 pairs of electrons and cations that represent a fragment of the track. The results reproduce the basic features of the track recombination in liquid argon observed in experiment.