Current wafer-scale fabrication methods for graphene-based electronics and sensors involve the transfer of single-layer graphene by a support polymer. This often leaves some polymer residue on the graphene, which can strongly impact its electronic, thermal, and mechanical resonance properties. To assess the cleanliness of graphene fabrication methods, it is thus of considerable interest to quantify the amount of contamination on top of the graphene. Here, we present a methodology for direct measurement of the mass of the graphene sheet using quartz crystal microbalances (QCM). By monitoring the QCM resonance frequency during removal of graphene in an oxygen plasma, the total mass of the graphene and contamination is determined with sub-graphene-monolayer accuracy. Since the etch-rate of the contamination is higher than that of graphene, quantitative measurements of the mass of contaminants below, on top, and between graphene layers are obtained. We find that polymer-based dry transfer methods can increase the mass of a graphene sheet by a factor of 10. The presented mass measurement method is conceptually straightforward to interpret and can be used for standardized testing of graphene transfer procedures in order to improve the quality of graphene devices in future applications. arXiv:1902.11098v1 [cond-mat.mes-hall]

Abstract. Corrosion is one of the industries major issues regarding the integrity of assets. Currently inspections are conducted at regular intervals to ensure a sufficient integrity level of these assets. Cost reduction while maintaining a high level of reliability and safety of installations is a major challenge. There are many situations where the actual defect location is not accessible, e.g., a pipe support or a partially buried pipe. In case of bottom of the line corrosion, i.e., a single corrosion pit, a simpler approach may be followed. Guided waves are propagated around the circumference of a pipe. In case of wall loss, the phase of the signal changes which is used to estimate the local wall thickness profile. A special EMAT sensor has been developed, which works in a pit-catch configuration at the 12 o'clock position using highly dispersive guided waves. In order to improve the sensitivity, an inversion in performed on multiple orders of circumferential passes. Experimental results are presented on different pipes containing artificial and real defects.