The fabrication of luminescent defects in single-crystal diamond upon Sn implantation and annealing is reported. The relevant spectral features of the optical centers (emission peaks at 593.5, 620.3, 630.7, and 646.7 nm) are attributed to Sn-related defects through the correlation of their photoluminescence (PL) intensity with the implantation fluence. Single Sn-related defects were identified and characterized through the acquisition of their second-order autocorrelation emission functions, by means of Hanbury-Brown and Twiss interferometry. The investigation of their single-photon emission regime as a function of excitation laser power revealed that Sn-related defects are based on three-level systems with a 6 ns radiative decay lifetime. In a fraction of the studied centers, the observation of a blinking PL emission is indicative of the existence of a dark state. Furthermore, absorption dependence on the polarization of the excitation radiation with ∼45% contrast was measured. This work shed light on the existence of a new optical center associated with a group-IV impurity in diamond, with similar photophysical properties to the already well-known Si–V and Ge–V emitters, thus, providing results of interest from both the fundamental and applicative points of view.

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We investigated the response of wurzite GaN thin films to energetic ion irradiation. Both swift heavy ions (92 MeV Xe 23+ , 23 MeV I 6+ ) and highly charged ions (100 keV Xe 40+ ) were used. After irradiation, the samples were investigated using atomic force microscopy, grazing incidence small angle X-ray scattering, Rutherford backscattering spectroscopy in channelling orientation and time of flight elastic recoil detection analysis. Only grazing incidence swift heavy ion irradiation induced changes on the surface of the GaN, when the appearance of nanoholes is accompanied by a notable loss of nitrogen. The results are discussed in the framework of the thermal spike model.

We present theoretical and experimental data on the threshold behaviour of nanodot creation with swift heavy ions. A model calculation based on a two-temperature model taking the spatially resolved electron density into account gives a threshold of 12 keV/nm below which the energy density at the end of the track is no longer high enough to melt the material. In the corresponding experiments we irradiated SrTiO 3 surfaces under grazing incidence with swift heavy ions. The resulting chains of nanodots were analyzed by atomic force microscopy. In addition, samples irradiated under normal incidence were analyzed by transmission electron microscopy. Both experiments show two thresholds, connected to the appearance of tracks and to the creation of fully developed tracks, respectively. The threshold values are similar for surface and bulk tracks, suggesting that the same processes occur at glancing and normal incidence. The experimental threshold for the formation of fully developed tracks compares well to the value obtained by the theoretical description.

We examine swift heavy ion-induced defect production in suspended single layer graphene using Raman spectroscopy and a two temperature molecular dynamics model that couples the ionic and electronic subsystems. We show that an increase in the electronic stopping power of the ion results in an increase in the size of the pore-type defects, with a defect formation threshold at 1.22-1.48 keV/layer. We also report calculations of the specific electronic heat capacity of graphene with different chemical potentials and discuss the electronic thermal conductivity of graphene at high electronic temperatures, suggesting a value in the range of 1 Wm −1 K −1. These results indicate that swift heavy ions can create nanopores in graphene, and that their size can be tuned between 1-4 nm diameter by choosing a suitable stopping power.