We measure in a nondestructive and noncontact fashion the thicknesses of three scale films with thicknesses 28.51.4 m, 13.4 0.9 m, and 5.1 0.3 m on steel substrates employing terahertz time-of-flight tomography combined with advanced signal-processing techniques. Wüstite is the dominant phase in the scale films, though magnetite and hematite are also present.Because wüstite is electrically insulating, the incident terahertz electromagnetic pulses largely penetrate into the scale film; however, the pulses are entirely reflected by the underlying electrically conductive steel substrate. Because the film layers are thin, in some cases optically thin, the distinct pulses reflected at the air/scale and scale/steel interfaces overlap in time and thus are not visually evident in the reflected terahertz signal, necessitating the use of deconvolution techniques to recover the sample structure. We compare the merits of three deconvolution techniques, one unsuccessful (frequency-wavelet domain deconvolution) and two successful (sparse deconvolution and autoregressive extrapolation), to characterize the thicknesses of these scale films.

The strain effect on graphene-encapsulated Au nanoparticles is investigated. A finite-element calculation is performed to simulate the strain distribution and morphology of the monolayer and multilayer graphene-encapsulated Au nanoparticles, respectively. It can be found that the inhomogeneous strain and deformation are enhanced with the increasing shrinkage of the graphene shell. Moreover, the strain distribution and deformation are very sensitive to the layer number of the graphene shell. Especially, the inhomogeneous strain at the interface between the graphene shell and encapsulated Au nanoparticles is strongly tuned by the graphene thickness. For the mono- and bilayer graphene-encapsulated Au nanoparticles, the dramatic shape transformation can be observed. However, with increasing the graphene thickness further, there is hardly deformation for the encapsulated Au nanoparticles. These simulated results indicate that the strain and deformation can be designed by the graphene layer thickness, which provides an opportunity to engineer the structure and morphology of the graphene-encapsulated nanoparticles.

The thickness of 2, 4, 6, 8, 10, and 12 mm thick polycarbonate (PC) and poly-methyl methacrylate (PMMA) sheets were characterized nondestructively by terahertz time-of-flight tomography in reflection. Due to terahertz attenuation and dispersion in the material, first characterized in transmission, features in the reflected signal associated with structure deep in the sample (i.e., the back interface) may be difficult to identify, and therefore signal processing is employed, namely frequency-wavelet domain deconvolution and a crosscorrelation approach in which we account for dispersion. The refractive indices are found to be = 1.67-0.0096 for PC and = 1.61-0.0085 for PMMA, while the absorption coefficients, which follow the form of the universal dielectric response, are = for PC and = for PMMA, where  is measured in THz and the absorption coefficient is in units of cm-1. We show that straightforward analysis techniques that neglect dispersion are limited to measuring layer thicknesses in these materials of less than ~17 mm, while accounting for dispersion results in a factor-of-two improvement, allowing us to measure samples as thick as ~36 mm.