In this study, galvanic coatings of Cu and Ni, typically applied in industrial standard routines, were investigated. Ablation experiments were carried out using the first two harmonic wavelengths of a pulsed Nd:YAG laser and the resulting plasma spectra were analysed using a linear Pearson correlation method. For both wavelengths the absorption/ablation behaviour as well as laser-induced breakdown spectroscopy (LIBS) depth profiles were studied varying laser fluences between 4.3-17.2 J/cm 2 at 532 nm and 2.9-11.7 J/cm 2 at 1064 nm. The LIBS-stratigrams were compared with energydispersive X-ray spectroscopy of cross-sections. The ablation rates were calculated and compared to theoretical values originating from a thermal ablation model. Generally, higher ablation rates were obtained with 532 nm light for both materials. The light-plasma interaction is suggested as possible cause of the lower ablation rates in the infrared regime. Neither clear evidence of the pure thermal ablation, nor correlation with optical properties of investigated materials was obtained.
We show the temporal change in repassivation mechanism as a time-dependent linear combination of a high-field model of oxide growth (HFM) and the point defect model (PDM). The observed switch in transient repassivation current-decrease under potentiostatic control occurs independently of the active electrode size and effective repassivation time for all applied overpotentials.For that,A mathematical model combines the well established theories of oxide-film formation and growth kinetics, giving insight in the non linear transient behaviour of micro-defect passivation.According to our findings, the repassivation process can be described as a charge consumption via two concurrent channels. While the major current-decay at the very beginning of the fast healing oxide follows a point-defect type exponential damping, the HFM mechanism supersedes gradually, the longer the repassivation evolves. Furthermore, the material seems to reminisce former laser treatments via defects built-in during depassivation, leading to a higher charge contribution of the PDM mechanism at higher pulse numbers.
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