Measurements of wall shear-stress streaks of a turbulent boundary layer in the channel ow were carried out using a MEMS-based micro-shear-stress imaging chip, which contains about 100 sensors. The chip is designed and fabricated by surface micromachining technology. One arrray of 25 micro-shear-stress sensors in the chip that covers a length of 7.5 mm is used to measure the instantaneous spanwise distribution of the surface shear stress. The statistics of high shear-stress streaks were established. Based on the measurement, the physical quantities associated with the high shear-stress streaks, such as their length, width and peak shear-stress level, were obtained. We found out that a high correlation exists between the peak shear-stress level and front-end shear-stress slope of a high shear-stress streak. This important property is currently being applied to the design of a real-time ow control logic.
The two-dimensional low-speed structure of a turbulent boundary layer has been clearly visualized by a combination of a shear stress sensor using micro electro mechanical systems and the discrete wavelet transform. The application of two-dimensional discrete wavelet transforms to the visualization of wall shear stress data obtained using the micro shear stress imaging chip is described. The experiment was carried out under various Reynolds number conditions. It is shown that it is possible to visualize the low-speed streak structure as contours of two-dimensional wavelet level corresponding to spanwise wave number as a function of Reynolds number.
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