Frequency modulation atomic force microscopy (FM-AFM) imaging in ionic liquids (ILs) were carried out. A quartz tuning fork sensor with a sharpened tungsten tip was used as a force sensor instead of a Si cantilever. Only the tip apex was immersed in ILs and the quality factor of the sensors was kept more than 100 in spite of the high viscosity of ILs. Atomic-resolution topographic imaging was successfully achieved in an IL as well as in an aqueous solution. In addition, frequency shift versus tip-to-sample distance curves were obtained and the structures of local solvation layers were studied.

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Structural analysis of the interfaces between an ionic liquid (IL) and an organic monolayer was carried out by phase modulation atomic force microscopy (PM-AFM). A quartz tuning fork sensor with a sharpened tungsten tip was used as a force sensor instead of a Si cantilever. Topographic imaging of the monolayer-covered Si(111) substrate revealed that the PM-AFM is capable of imaging the atomic steps originating from the substrate in an IL. We also carried out force curve measurement using the PM-AFM in order to directly confirm the presence of solvation layers and revealed that at least 4 layers, each with a thickness of 0.77 nm, were formed on the interface. In addition, we obtained topographic images at different driving frequencies and indicated that it is possible to image not only the sample surface but also the solvation layers formed on the IL/monolayer interface.