Abstract. We present new constraints on the couplings of axions and more generic axionlike particles using data from the EDELWEISS-II experiment. The EDELWEISS experiment, located at the Underground Laboratory of Modane, primarily aims at the direct detection of WIMPs using germanium bolometers. It is also sensitive to the low-energy electron recoils that would be induced by solar or dark matter axions. Using a total exposure of up to 448 kg.d, we searched for axion-induced electron recoils down to 2.5 keV within four scenarios involving different hypotheses on the origin and couplings of axions. We set a 95 % CL limit on the coupling to photons g Aγ < 2.13 × 10 −9 GeV −1 in a mass range not fully covered by axion helioscopes. We also constrain the coupling to electrons, g Ae < 2.56 × 10 −11 , similar to the more indirect solar neutrino bound. Finally we place a limit on g Ae × g eff AN < 4.70 × 10 −17 , where g eff AN is the effective axion-nucleon coupling for 57 Fe. Combining these results we fully exclude the mass range 0.91 eV < m A < 80 keV for DFSZ axions and 5.73 eV < m A < 40 keV for KSVZ axions.
The EDELWEISS-II collaboration has completed a direct search for WIMP dark matter using cryogenic Ge detectors (400 g each) and 384 kg×days of effective exposure. A cross-section of 4.4 × 10 −8 pb is excluded at 90% C. L. for a WIMP mass of 85 GeV. The next phase, EDELWEISS-III, aims to probe spin-independent WIMP-nucleon cross-sections down to a few ×10 −9 pb. We present here the study of gamma and neutron background coming from radioactive decays in the set-up and shielding materials. We have carried out Monte Carlo simulations for the completed EDELWEISS-II setup with GEANT4 and normalised the expected background rates to the measured radioactivity levels (or their upper limits) of all materials and components. The expected gamma-ray event rate in EDELWEISS-II at 20-200 keV agrees with the observed rate of 82 events/kg/day within the uncertainties in the measured concentrations. The calculated neutron rate from radioactivity of 1.0-3.1 events (90% C. L.) at 20-200 keV in the EDELWEISS-II data together with the expected upper limit on the misidentified gamma-ray events (≤ 0.9), surface betas (≤ 0.3), and muon-induced neutrons (≤ 0.7), do not contradict 5 observed events in nuclear recoil band. We have then extended the simulation framework to the EDELWEISS-III configuration with 800 g crystals, better material purity and additional neutron shielding inside the cryostat. The gamma-ray and neutron backgrounds in 24 kg fiducial mass of EDELWEISS-III have been calculated as 14-44 events/kg/day and 0.7-1.4 events per year, respectively. The results of the background studies performed in the present work have helped to select better purity components and improve shielding in EDELWEISS-III to further reduce the expected * Corresponding authors: v.kudryavtsev@sheffield.ac.uk, ploaiza@lsm. rate of background events in the next phase of the experiment.
In this paper, we describe QUBIC, an experiment that will observe the polarized microwave sky with a novel approach, which combines the sensitivity of state-of-the-art bolometric detectors with the systematic effects control typical of interferometers. QUBIC’s unique features are the so-called “self-calibration”, a technique that allows us to clean the measured data from instrumental effects, and its spectral imaging power, i.e., the ability to separate the signal into various sub-bands within each frequency band. QUBIC will observe the sky in two main frequency bands: 150 GHz and 220 GHz. A technological demonstrator is currently under testing and will be deployed in Argentina during 2019, while the final instrument is expected to be installed during 2020.
The ion flux on the wafer surface during plasma immersion ion implantation is investigated by three-dimensional simulations and experiments. Due to the finite size of the wafer and its stage, the evolving sheath acts as a lens that focuses the positive ions to distinct regions on the wafer surface. Depending on the sheath profile, two focusing effects are identified. Discrete focusing involves ions entering the sheath from its frontal side and leads to the formation of a passive surface near the wafer edge, while the modal focusing affects ions entering the sheath from the lateral side of the stage and are eventually directed to the wafer center.
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