No abstract

A simple accessory suitable for analysis of trace impurities at the parts per million level consists of a condenser column which can be substituted for the sampling volume tube in the Perkin-Elmer precision gas sampling system. This condenser column can be fitted with selected column materials, depending upon the problem. The new condenser system makes it possible to concentrate trace impurities from large sample volumes. Using large enough sample volumes, the minimum detectability of the system is at or below 0.1 p.p.m.

No abstract

No abstract

No abstract