No abstract

Pull-in instability, as an inherent nonlinear problem, continues to become an increasingly important and interesting topic in the design of electrostatic Nano/Micro-electromechanical systems (N/MEMS) devices. Generally, the pull-in instability was studied in a continuous space, but when the electronic devices work in a porous medium, they need to be analyzed in a fractal partner. In this paper, we establish a fractal model for N/MEMS, and find a pull-in stability plateau, which can be controlled by the porous structure, and the pull-in instability can be finally converted to a stable condition. As a result, the pull-in instability can be completely eliminated, realizing the transformation of pull-in instability into pull-in stability.

This paper highlights Li-He’s approach in which the enhanced perturbation method is linked with the parameter expansion technology in order to obtain frequency amplitude formulation of electrically actuated microbeams-based microelectromechanical system (MEMS). The governing equation is a second-order nonlinear ordinary differential equation. The obtained results are compared with the solution achieved numerically by the Runge-Kutta (RK) method that shows the effectiveness of this variation in the homotopy perturbation method (HPM).

The nano/microelectromechanical systems (N/MEMS) have caught much attention in the past few decades for their attractive properties such as small size (low mass), high reliability (high thermal conductivity and high Young's modulus), batch fabrication, and low power consumption. The dynamic oscillatory behavior of these systems is very complex due to strong nonlinearities in these systems. The basic aim of this manuscript is to investigate the nonlinear vibration property of N/MEMS oscillators arising in nanotube‐based N/MEMS and resonators by the homotopy perturbation method coupled with Laplace transform (also called as He‐Laplace method in literature). A generalized N/MEMS oscillator is systematically studied, and a fairly accurate analytic solution is obtained. Three special cases for electrically actuated MEMS, multi‐walled carbon nanotubes‐based MEMS, and MEMS subjected to van der Waals attraction are considered for comparison, and a good agreement with exact solutions is observed.