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Selecting the decisive spectral bands is a key issue in unsupervised hyperspectral band selection techniques. These methods are the most popular ways for dimensionality reduction of original data. A compact data representation without compromising the physical information and optimizing the separation between different materials are the main objectives of such selection processes. In this work, a hyperspectral band selection approach is proposed based on linear spectral unmixing and sequential clustering techniques. The use of these two specific techniques constitutes the main novelty of this investigation. The proposed approach operates in different successive steps. It starts with extracting material spectra contained in the considered data using an unmixing method. Then, the variance of extracted spectra samples is calculated at each wavelength, which results in a variances vector. This one is segmented into a fixed number of clusters using a sequential clustering strategy. Finally, only one spectral band is selected for each segment. This band corresponds to the wavelength at which a maximum variance value is obtained. Experiments on three real hyperspectral data demonstrate the superiority of the proposed approach in comparison with four methods from the literature.

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The pan-sharpening is a widely used operation in remote sensing image processing, this operation aims at combining an observable high spatial resolution panchromatic image with a multispectral one, to generate an unobservable image with the high spatial resolution of the former and a high spectral resolution of the latter. Generally, papers dealing with this problem omit the geometric part and suppose that these images are perfectly aligned, which is not necessarily the case for the raw imagery, where even the different bands in the multispectral imagery are misaligned. In this paper, new method for multispectral and panchromatic image registration is proposed to deal with the misalignment problem that reduces the pansharpening quality. This method called Dense Vector Matching (DVM) is based on the matching of a whole line-vector or column-vector from a reference band with the corresponding vector in a target band. DVM is applied on real data and has given acceptable results, where the QNR index of the pan-sharpening is better for images after band registration, also the registration error is reduced to sub-pixel using the proposed approach.